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LeafOS
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LeafOS-Project
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android_art
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ec11c672f9a17d7588e75e5cb436fb824e947a21
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test
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635-checker-arm64-volatile-load-cc
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Regression test checking that the VIXL ARM64 scratch register pool is
not exhausted when generating a volatile field load with a large
offset with (Baker) read barriers (b/34726333).