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| author | 2022-02-24 15:39:21 +0000 | |
|---|---|---|
| committer | 2022-02-24 23:14:26 +0000 | |
| commit | 713a041090d2cffde0f53ad1652652057adb5196 (patch) | |
| tree | 21704dfdaddadf94ed9261d8c8ad8743a3837b5c /compiler/optimizing/loop_optimization.h | |
| parent | 4625f2510ba611459250f1f715faeb2efa2cfb14 (diff) | |
Use larger timeouts in odsign_e2e_tests.
The timeouts were too small and inappropiate for less performant
devices. Since the test is now in CTS, we should use larger timeouts so
that it can work for all devices and build/test configurations.
Bug: 221096883
Test: atest odsign_e2e_tests
Change-Id: Id89f6b3c0aec607a70d08f295fbc07a749b64296
Diffstat (limited to 'compiler/optimizing/loop_optimization.h')
0 files changed, 0 insertions, 0 deletions