commit | 713a041090d2cffde0f53ad1652652057adb5196 | [log] [tgz] |
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author | Jiakai Zhang <jiakaiz@google.com> | Thu Feb 24 15:39:21 2022 +0000 |
committer | Treehugger Robot <treehugger-gerrit@google.com> | Thu Feb 24 23:14:26 2022 +0000 |
tree | 21704dfdaddadf94ed9261d8c8ad8743a3837b5c | |
parent | 4625f2510ba611459250f1f715faeb2efa2cfb14 [diff] |
Use larger timeouts in odsign_e2e_tests. The timeouts were too small and inappropiate for less performant devices. Since the test is now in CTS, we should use larger timeouts so that it can work for all devices and build/test configurations. Bug: 221096883 Test: atest odsign_e2e_tests Change-Id: Id89f6b3c0aec607a70d08f295fbc07a749b64296