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LeafOS / LeafOS-Devices / android_kernel_samsung_universal7904 / 573279bb43b4ed1efc7ea396fd7bb01f4deba707 / . / tools / perf / tests / attr
tree: e260db52fbc334efc2ee3a7c415c085e47c5e50c [path history] [tgz]
  1. base-record
  2. base-stat
  3. README
  4. test-record-basic
  5. test-record-branch-any
  6. test-record-branch-filter-any
  7. test-record-branch-filter-any_call
  8. test-record-branch-filter-any_ret
  9. test-record-branch-filter-hv
  10. test-record-branch-filter-ind_call
  11. test-record-branch-filter-k
  12. test-record-branch-filter-u
  13. test-record-C0
  14. test-record-count
  15. test-record-data
  16. test-record-freq
  17. test-record-graph-default
  18. test-record-graph-dwarf
  19. test-record-graph-fp
  20. test-record-group
  21. test-record-group-sampling
  22. test-record-group1
  23. test-record-no-delay
  24. test-record-no-inherit
  25. test-record-no-samples
  26. test-record-period
  27. test-record-raw
  28. test-stat-basic
  29. test-stat-C0
  30. test-stat-default
  31. test-stat-detailed-1
  32. test-stat-detailed-2
  33. test-stat-detailed-3
  34. test-stat-group
  35. test-stat-group1
  36. test-stat-no-inherit