| commit | 7bfbc6e3fbd9ae35b28db1839689b7eb4025c93d | [log] [tgz] |
|---|---|---|
| author | Andrzej Pietrasiewicz <andrzej.p@samsung.com> | Tue Dec 16 14:56:27 2014 +0100 |
| committer | Felipe Balbi <balbi@ti.com> | Mon Jan 12 12:13:24 2015 -0600 |
| tree | d25740cdc142fd4f45fbc77fdf1cbbc1fdbfaadd | |
| parent | d5862ca6da545ec63ec2d2a8c687bf214c87e00e [diff] |
Documentation: usb: ECM subset function testing Summary of how to test ECM subset function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>