IIO: core: Modify scan element type
The current scan element type uses the following format:
[be|le]:[s|u]bits/storagebits[>>shift].
To specify multiple elements in this type, added a repeat value.
So new format is:
[be|le]:[s|u]bits/storagebitsXr[>>shift].
Here r is specifying how may times, real/storage bits are repeating.
When X is value is 0 or 1, then repeat value is not used in the format,
and it will be same as existing format.
Signed-off-by: Srinivas Pandruvada <srinivas.pandruvada@linux.intel.com>
Signed-off-by: Jonathan Cameron <jic23@kernel.org>
2 files changed